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Final Program


ViewAttendees 4

Analytical Sciences Symposia

A04.2 - Contributions of Analytical Electron Microscopy to Understanding Microstructural Evolution in Materials: James Bentley Memorial Symposium

The Evolution of Analytical Metrology for High Spatial Resolution and Sensitivity in the Analytical Transmission Electron Microscope

Tuesday, July 29, 2025
1:30 PM - 2:00 PM MT
Location: 151 ABC

All papers can be viewed in the published Meeting Proceedings on the MaM journal website.