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Final Program


ViewAttendees 4

Cross-Disciplinary Symposia

C06.6 - Advancements in Generative Artificial Intelligence and Automation for Electron Microscopy

Deep learning based sinogram inpainting for fast and high-quality artifact correction in electron tomography

Thursday, July 31, 2025
2:15 PM - 2:30 PM MT
Location: 251 A

All papers can be viewed in the published Meeting Proceedings on the MaM journal website.

    Presenting Author(s)

  • Obaidullah Rahman

    Data Analytics Researcher for Computational lmaging
    Oak Ridge National Laboratory
    University of Notre Dame
    Oak Ridge, TN, United States

    • Co-Author(s)

  • SV

    Singanallur Venkatakrishnan

    R&D Research Associate
    Oak Ridge National Laboratory
    Oak Ridge, Tennessee, United States

  • DC

    David Cullen

    Senior R&D Staff Scientist
    Oak Ridge National Laboratory, Tennessee, United States

  • Amir Ziabari

    R&D Research Associate
    Oak Ridge National Laboratory
    Oak Ridge, Tennessee, United States