TOFWERK
Thun, Bern, United States
Over 20 years experience of mass spectrometry and instrument development in academic and commercial environments. Deputy product manager for TOFWERK's 'fibTOF' FIB-SIMS product - a mass analyzer that converts a FIB-SEM microscope to a secondary ion mass spectrometer, capable of nanometer-scale chemical imaging of minor elements.
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From thin film to battery: FIB-SIMS with TOF technology for high resolution chemical imaging
Monday, July 28, 2025
1:30 PM - 2:00 PM MT