Elliot J. Fuller, Ph.D

Sandia National Labs, United States

Disclosure information not submitted.

Presentation(s):

• In-situ Characterization of High-Temperature Transitions in Materials for Next Generation Computing via STEM Imaging and EELS

  Tuesday, July 29, 2025
  8:30 AM - 8:45 AM MT

• Secondary Electron Plume Imaging and Applications for Mapping Electric Fields

  Thursday, July 31, 2025
  8:30 AM - 8:45 AM MT