Lucille A Giannuzzi, PhD (she/her/hers)

Business Development Manager
TESCAN USA, United States

Disclosure information not submitted.

Presentation(s):

• The effect of ion energy application on damage induced in (S)TEM samples and the area of their creation respectively to the sample surface using different ion species and techniques

  Monday, July 28, 2025
  2:45 PM - 3:00 PM MT

• S/TEM Analysis of Protective FIB Coatings

  Tuesday, July 29, 2025
  11:45 AM - 12:00 PM MT