Associate Engineer
University of Florida, United States
Nicholas G. Rudawski received his B.S.E. degree in Materials Science and Engineering from the University of Michigan in 2005, where he developed his initial interest in electron microscopy. He completed his Ph.D. degree in Materials Science and Engineering from the University of Florida in 2008, which involved extensive use of dual focused ion beam/scanning electron microscopy (FIB/SEM) and scanning/transmission electron microscopy (S/TEM). He completed additional post-doctoral training at the University of California at Santa Barbara from 2009 to 2010 focusing on atomic-resolution STEM followed by a second stint at the University of Florida from 2010 to 2012 once again emphasizing use of dual FIB/SEM and S/TEM.
He joined the Nanoscale Research Facility (previously called the Research Service Centers) at the University of Florida in 2012 as a service/teaching faculty in the Herbert Wertheim College of Engineering where he is the primary staff member overseeing training, maintenance, operation, and service of three S/TEMs, three dual FIB/SEMs, and one SEM.
In 2018, while teaching a graduate-level course on S/TEM, he used his cell phone to clumsily record live video demonstrations of himself operating an FEI Tecnai F20 S/TEM as supplementary course material for his students. He then created a public, open access YouTube channel as a platform to disseminate his videos and significant interest from the electron microscopy community quickly followed. At present, his channel has over 120 videos providing hours of electron microscopy-related content to over 5200 subscribers worldwide. He considers his YouTube channel his most important professional accomplishment to date.
A prolific publisher of research, he has contributed nearly 70 peer-reviewed publications involving electron microscopy including articles in Nature Electronics, Physical Review Letters, and many other high-quality, high-impact journals. Additionally, he has contributed nearly 40 conference presentations (with 5 invited), 5 book chapters, 2 invited webinars, and 1 patent.
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Evaporated Si Protective Coatings for FIB-prepared High-Quality S/TEM Lamellas
Tuesday, July 29, 2025
11:15 AM - 11:30 AM MT