John Villarrubia, Ph.D (he/him/his)

NIST
Gaithersburg, Maryland, United States

Disclosure information not submitted.

Presentation(s):

• Large Area Real-Space Crystallography and Thickness Determination of Mesoscopic Semiconductor Membranes Using Zone Axis Patterns and Correlative SEM-S/TEM Modes

  Tuesday, July 29, 2025
  8:30 AM - 9:00 AM MT