Head of Research and Development
IONTOF Technologies GmbH
Muenster, Germany
Since 2001 employed at IONTOF Technologies GmbH, head of RnD. Development of significant advancements related to TOF-SIMS analytical instrumentation, specifically Bi and BiMn cluster ion sources, and analytical improvements in spectrometer technology, and high spatial resolution imaging.
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Hybrid SIMS: Secondary Ion Mass Spectrometry Imaging with High Mass Resolving Power
Wednesday, July 30, 2025
8:30 AM - 9:00 AM MT