Challenges in measuring low concentration of overlapping elements with EDS and need for verification with standard materials

Presenting Author(s)

• 

  Lucia Spasevski, Ph.D (she/her/hers)

  Product Manager
  Oxford Instruments NanoAnalysis
  High Wycombe, United Kingdom

Co-Author(s)

• 

  Simon Burgess, Ph.D

  Business Manager
  Oxford Instruments NanoAnalysis
  High Wycombe, England, United Kingdom
• 

  Philippe Pinard, Ph.D

  Director of Research
  Oxford Instruments NanoAnalysis
  High Wycombe, United Kingdom
• JZ

  John Qing Zhang, Ph.D

  Oxford Instruments NanoAnalysis
  High Wycombe, United Kingdom
• KM

  Katherine MacArthur, PhD CEng

  Oxford Instruments, United States