Physical Sciences Symposia

The Crucial Role of TEM Specimen Preparation in STEM EBIC Analysis of Advanced Semiconductor Devices

Presenting Author(s)

• 

  Cecile S. Bonifacio, PhD (she/her/hers)

  Senior Applications Scientist
  E.A. Fischione Instruments Inc.
  Export, PA, United States

Co-Author(s)

• 

  William Hubbard, PhD

  CEO
  NanoElectronic Imaging Inc.
  Riverside, California, United States
• RL

  Richard Li

  Sales/Service Manager for Taiwan
  E. A. Fischione Instruments, Inc.
  Export, Pennsylvania, United States
• MR

  Mary Ray

  Marketing and Communications Manager
  E. A. Fischione Instruments, Inc.
  Export, Pennsylvania, United States
• PF

  Paul Fischione

  CEO
  E. A. Fischione Instruments, Inc.
  Export, Pennsylvania, United States