Cecile S. Bonifacio, PhD (she/her/hers)

Senior Applications Scientist
E.A. Fischione Instruments Inc.
Export, PA, United States

Cecile Bonifacio is a senior applications scientist at E.A. Fischione Instruments, Inc. Cecile has more than 20 years of experience in TEM specimen preparation and high-resolution TEM/STEM imaging and analysis. She is a regular instructor at Lehigh University’s annual microscopy school, has authored more than 60 publications, and is a frequent presenter at professional meetings. She received her Electron Microscopy certificate degree from San Joaquin Delta College, and advanced degrees in chemical engineering; M.S. at San Jose State University and PhD at from the University of California-Davis.

Disclosure information not submitted.

Presentation(s):

• The Crucial Role of TEM Specimen Preparation in STEM EBIC Analysis of Advanced Semiconductor Devices

  Tuesday, July 29, 2025
  11:15 AM - 11:30 AM MT

• Evaluating APT Specimen Survivability: Site-specific Post-FIB Ar Ion Milling in Controlled Environments

  Tuesday, July 29, 2025
  1:30 PM - 1:45 PM MT