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Final Program


ViewAttendees 2

Physical Sciences Symposia

P08.8 - Advanced Imaging, Diffraction, and Spectroscopy of Structurally or Chemically Disordered Materials

Low-dose Imaging Using Single-electron Detection with an Integration-type SOI Pixel Detector in Transmission Electron Microscopy

Thursday, July 31, 2025
4:00 PM - 4:15 PM MT
Location: Ballroom C

All papers can be viewed in the published Meeting Proceedings on the MaM journal website.

    Presenting Author(s)

  • Yuichi Ishida (he/him/his)

    Graduate School of Engineering, Nagoya University
    Nagoya, Aichi, Japan

    • Co-Author(s)

  • TI

    Takafumi Ishida

    Assistant Professor
    Institute of Materials and Systems for Sustainability, Nagoya University
    Nagoya University , Japan

  • MK

    Makoto Kuwahara

    Institute of Materials and Systems for Sustainability, Nagoya University, Japan

  • YA

    Yasuo Arai

    Accelerator Laboratory, High Energy Accelerator Research Organization (KEK), Japan

  • KS

    Koh Saitoh

    Institute of Materials and Systems for Sustainability, Nagoya University, Japan