Yuichi Ishida (he/him/his)

Graduate School of Engineering, Nagoya University
Nagoya, Aichi, Japan

Disclosure information not submitted.

Presentation(s):

• High-Speed Recordable Direct Electron Detection Cameras Using SOI-CMOS Technology for Dynamical Observation in Transmission Electron Microscopy

  Thursday, July 31, 2025
  9:30 AM - 9:45 AM MT

• Low-dose Imaging Using Single-electron Detection with an Integration-type SOI Pixel Detector in Transmission Electron Microscopy

  Thursday, July 31, 2025
  4:00 PM - 4:15 PM MT