Physical Sciences Symposia

Evaluating TEM Sample Thickness for Enhanced Temperature Precision in Plasmon Energy Expansion Thermometry (PEET)

Presenting Author(s)

• JJ

  Joerg Jinschek, Prof. (he/him/his)

  Professor
  Technical University of Denmark (DTU)
  Technical University of Denmark (DTU)
  Kgs Lyngby, Hovedstaden, Denmark

Co-Author(s)

• 

  Yi-Chieh Yang (she/her/hers)

  PhD student
  Technical University of Denmark (DTU)
  Danmarks Tekniske Universitet
  Naerum, Denmark
• LS

  Luca Serafini (he/him/his)

  EMAT, University of Antwerp, Belgium
• NG

  Nicolas Gauquelin (he/him/his)

  EMAT, University of Antwerp
  (1) NANOlab Center of Excellence, University of Antwerp, Antwerp, Belgium, Belgium
• JV

  Johan Verbeeck, Prof. (he/him/his)

  Research Scientist
  EMAT, University of Antwerp
  (1) NANOlab Center of Excellence, University of Antwerp, Antwerp, Belgium, Belgium