Johan Verbeeck, Prof. (he/him/his)

Research Scientist
EMAT, University of Antwerp
(1) NANOlab Center of Excellence, University of Antwerp, Antwerp, Belgium, Belgium

Disclosure information not submitted.

Presentation(s):

• Evaluating TEM Sample Thickness for Enhanced Temperature Precision in Plasmon Energy Expansion Thermometry (PEET)

  Tuesday, July 29, 2025
  1:45 PM - 2:00 PM MT

• A new framework for acquisition and processing of event-driven 4D STEM

  Thursday, July 31, 2025
  4:15 PM - 4:30 PM MT