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Final Program


ViewAttendees 4

Physical Sciences Symposia

P02.3 - Electron Microscopy for Ferroic Materials: From Atomic-scale Imaging to in-situ Control

In situ Atomic-Scale Imaging Unveils Clamping-Enhanced Strain and Phase Transition Pathways in Antiferroelectric Thin Films

Thursday, July 31, 2025
8:30 AM - 8:45 AM MT
Location: 250 C

All papers can be viewed in the published Meeting Proceedings on the MaM journal website.

    Presenting Author(s)

  • MZ

    Menglin Zhu

    Graduate Student
    Massachusetts Institute of Technology, United States

    • Co-Author(s)

  • MX

    Michael Xu

    Graduate Student
    Massachusetts Institute of Technology
    Massachusetts Institute of Technology
    Medford, MA, United States

  • CG

    Colin Gilgenbach

    Massachusetts Institute of Technology
    Cambridge, Massachusetts, United States

  • HP

    Hao Pan

    Peking University, United States

  • LM

    Lane W. Martin

    Rice University, United States

  • JL

    James LeBeau, Ph.D

    Professor
    Massachusetts Institute of Technology
    Cambridge, Massachusetts, United States