Colin Gilgenbach

Massachusetts Institute of Technology
Cambridge, Massachusetts, United States

Disclosure information not submitted.

Presentation(s):

• Measurement of Space Charge Layers using Multislice Electron Ptychography

  Tuesday, July 29, 2025
  9:45 AM - 10:00 AM MT

• Tuning the Atomic Number Sensitivity in Multislice Electron Ptychography

  Tuesday, July 29, 2025
  2:00 PM - 2:15 PM MT

• Structural and Electronic Properties of 3C/4H-SiC Interface using Multislice Electron ptychography

  Wednesday, July 30, 2025
  9:00 AM - 9:15 AM MT

• In situ Atomic-Scale Imaging Unveils Clamping-Enhanced Strain and Phase Transition Pathways in Antiferroelectric Thin Films

  Thursday, July 31, 2025
  8:30 AM - 8:45 AM MT