Byeongjun Gil

Brookhaven National Laboratory
Seoul National University

Poster(s):

• (351) Complexities in Electron Beam Induced Current (EBIC) Image Formation in Low-Impedance Specimens
  Wednesday, July 30, 2025

  3:00 PM - 5:00 PM MT

• (311) Live User-Guided Low Dose Scanning Transmission Electron Microscopy Imaging
  Wednesday, July 30, 2025

  3:00 PM - 5:00 PM MT

• (117) Quantitative Study of Electron Beam Damage in Metal Halide Perovskites using Nanobeam Diffraction
  Tuesday, July 29, 2025

  3:00 PM - 5:00 PM MT