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Final Program


Analytical Sciences Symposia

Category: Featured Syposium

A04.P1 - Contributions of Analytical Electron Microscopy to Understanding Microstructural Evolution in Materials: James Bentley Memorial Symposium

(117) Quantitative Study of Electron Beam Damage in Metal Halide Perovskites using Nanobeam Diffraction

Tuesday, July 29, 2025
3:00 PM - 5:00 PM MT

    Presenting Author(s)

  • BG

    Byeongjun Gil

    Brookhaven National Laboratory
    Seoul National University, United States

    • Co-Author(s)

  • MH

    Myung-Geun Han (he/him/his)

    Physicist
    Brookhaven National Laboratory
    Upton, NY, United States

  • YZ

    Yimei Zhu

    Senior Scientist
    Brookhaven National Laboratory
    Upton, New York, United States

  • Ray Egerton

    emeritus professor
    University of Alberta
    University of Alberta
    Canmore, AB, United States

  • MK

    Miyoung Kim

    Professor
    Seoul National University, United States