Yimei Zhu

Senior Scientist
Brookhaven National Laboratory

Poster(s):

• (351) Complexities in Electron Beam Induced Current (EBIC) Image Formation in Low-Impedance Specimens
  Wednesday, July 30, 2025

  3:00 PM - 5:00 PM MT

• (209) Technological Advancements in the Tunability and Applications of Electrically Driven Ultrafast Electron Microscopy
  Tuesday, July 29, 2025

  3:00 PM - 5:00 PM MT

• (311) Live User-Guided Low Dose Scanning Transmission Electron Microscopy Imaging
  Wednesday, July 30, 2025

  3:00 PM - 5:00 PM MT

• (117) Quantitative Study of Electron Beam Damage in Metal Halide Perovskites using Nanobeam Diffraction
  Tuesday, July 29, 2025

  3:00 PM - 5:00 PM MT

• (304) Polarization-Controlled Structural Modulation in the Single Atomic Layer at the PbZr0.2Ti0.8O3 LaNiO3 Interface
  Wednesday, July 30, 2025

  3:00 PM - 5:00 PM MT