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Final Program


ViewAttendees 12

Cross-Disciplinary Symposia

C07.2 - Towards Functional Imaging of Materials: Advances and Insights from Phase Contrast Techniques

Measurement of Space Charge Layers using Multislice Electron Ptychography

Tuesday, July 29, 2025
9:45 AM - 10:00 AM MT
Location: 250 F

All papers can be viewed in the published Meeting Proceedings on the MaM journal website.

    Presenting Author(s)

  • CG

    Colin Gilgenbach

    Massachusetts Institute of Technology
    Cambridge, Massachusetts, United States

    • Co-Author(s)

  • TD

    Thomas Defferriere, Ph.D

    Massachusetts Institute of Technology
    Cambridge, Massachusetts, United States

  • HT

    Harry L. Tuller, Ph.D

    Massachusetts Institute of Technology
    Cambridge, Massachusetts, United States

  • JL

    James LeBeau, Ph.D

    Professor
    Massachusetts Institute of Technology
    Cambridge, Massachusetts, United States