Physical Sciences Symposia

Structural and Electronic Properties of 3C/4H-SiC Interface using Multislice Electron ptychography

Presenting Author(s)

• JK

  Junghwa Kim, Ph.D (she/her/hers)

  Massachusetts Institute of Technology
  Cambridge, Massachusetts, United States

Co-Author(s)

• CG

  Colin Gilgenbach

  Massachusetts Institute of Technology
  Cambridge, Massachusetts, United States
• 

  Aaditya Bhat

  Massachusetts Institute of Technology
  Cambridge, MA, United States
• KH

  Katherine Harmon, Ph.D

  Stanford University, United States
• FH

  F. Joseph Heremans, Ph.D

  Argonne National Laboratory, United States
• MH

  Matthew J. Highland, Ph.D

  Argonne National Laboratory, United States
• SH

  Stephan O. Hruszkewycz, Ph.D

  Argonne National Laboratory
  Lemont, Illinois, United States
• JL

  James LeBeau, Ph.D

  Professor
  Massachusetts Institute of Technology
  Cambridge, Massachusetts, United States