Tizian Lorenzen

Ludwig-Maximilians University Munich

Poster(s):

• (9) Aberration Measurement by Electron Ptychography and Consistency Among Different Algorithms
  Monday, July 28, 2025

  3:00 PM - 5:00 PM MT

• (34) Crystal-Orientation-Dependent Image Contrast for Largely Defocused HAADF STEM Imaging
  Monday, July 28, 2025

  3:00 PM - 5:00 PM MT