Takafumi Ishida

Assistant Professor
Institute of Materials and Systems for Sustainability, Nagoya University
Nagoya University , Japan

Takafumi Ishida is an assistant professor at the Advanced Measurement Technology Center of Nagoya University in Japan. His work focuses on the development of equipment and observation methods for transmission electron microscopes. Recently, he has been working on the development of direct electron detectors using silicon-on-insulator technology and their application to time-resolved imaging in transmission electron microscopy.

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Presentation(s):

• High-Speed Recordable Direct Electron Detection Cameras Using SOI-CMOS Technology for Dynamical Observation in Transmission Electron Microscopy

  Thursday, July 31, 2025
  9:30 AM - 9:45 AM MT

• Low-dose Imaging Using Single-electron Detection with an Integration-type SOI Pixel Detector in Transmission Electron Microscopy

  Thursday, July 31, 2025
  4:00 PM - 4:15 PM MT