Bruker AXS LLC, WA, United States
Joel is a staff scientist at Bruker AXS (formerly Nion R&D). He graduated with a PhD in Mechanical Engineering from Stanford University in January 2024, with his thesis topic being 'Imaging photo-excited states at the 1 nanometer scale using electron microscopy'. His areas of expertise include electron microscopy instrumentation development, SEM and STEM imaging and spectroscopy, 4D STEM and optical design.
Disclosure information not submitted.
STEM for Biological Low Dose Structure Imaging
Wednesday, July 30, 2025
11:15 AM - 11:30 AM MT
Quantifying the surface sensitivity of atomic resolution secondary electron imaging
Thursday, July 31, 2025
1:30 PM - 1:45 PM MT