CEO
NanoElectronic Imaging Inc.
Riverside, California, United States
William A. Hubbard earned a B.S. in physics and mathematics from Boston University in 2008, after which he worked as a research assistant in the Harvard University Physics Department until 2010. He received his Ph.D. in condensed matter experimental physics in 2017 from the University of California, Los Angeles, where he was a postdoctoral scholar until 2019. He is currently the CEO of NanoElectronic Imaging Inc. (NEI), which was founded in 2017. His research focuses on nanoscale device physics and the development of TEM-based techniques for detecting electronic and thermal signals in operating devices.
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The Crucial Role of TEM Specimen Preparation in STEM EBIC Analysis of Advanced Semiconductor Devices
Tuesday, July 29, 2025
11:15 AM - 11:30 AM MT
SE For Free: Constructing Secondary Electron Images from Two-Channel STEM EBIC
Tuesday, July 29, 2025
11:45 AM - 12:00 PM MT
Live STEM Imaging of Electronic Device Performance Degradation under Beta Radiation
Wednesday, July 30, 2025
2:15 PM - 2:30 PM MT
The Effect of Electrode Structure on Ferroelectric Domains in Hf0.5Zr0.5O2
Thursday, July 31, 2025
2:15 PM - 2:30 PM MT